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1.Atomic force microscopy

Atomic force microscopy : understanding basic modes and advanced applications / Greg Haugstad Hoboken : Wiley, a John Wiley & Sons, Inc., 2012 . xxii, 464 stran . ISBN 978-0-470-63882-8 (vázáno) . http://www.loc.gov/catdir/enhancements/fy1215/2012003429-t.html . [1, currently available 0]

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